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| Rental service is abirable for domestic Japan | ||||
| IR-1300 | ||||
| You can see the state of the IC pattern clearly with an infrared light
and infrared camera from the back side of the silicon chip. IR -1300 displays a clear image with real-time processing software (DT enhancer) |
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| Characteristic |
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| *Support X100 objecyive lens for option. | ||||
| *It is easy to set focus, XY stage position | ||||
| *130Mega pixel Infrared CMOS Camera. | ||||
| *Usability improved by the additional function of the DT enhancer software. | ||||
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| IR-1300(IR-Micro scope, NotePC with software) | X,Y stage | |||
| DT-Enhancer(real-time image enhance software) | ||||
| The DT enhancer pressce a low contrast image to the bright clear image. |
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| Main function | ||||
| -Image capture- | ||||
| ・8bit monocrome | ||||
| -Display Image- | ||||
| *Full screen display *Zoom display(X2-X10) | ||||
| -Efect prsessing- | ||||
| *Brightness proseccing *Integral processing | ||||
| -Measure function- | ||||
| *Scale display *Area measure * Saize measure | ||||
| -Figure drawing- | ||||
| *Circle *Square *Arrow *Text | ||||
| -File management- | ||||
| *BMP File save/load *One click save | ||||
| *Original screen save *Origonal screen with drawing data. | ||||
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| Display image sample | ||||
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| System stracture | ||||
| Object sample | ||||
| Si Silicon wafer | ||||
| IR-camera | ||||
| 130mega pixel C-MOS camera | ||||
| InGaAs camera (option) | ||||
| Main versatile | ||||
| Filip chip status, Boid inspection, IC pattern check | ||||
| Alignment mark difference measure of sandwich wafer. | ||||
| Oxide size measure of VCSEL wafer. | ||||
| Basic specification | ||||
| Objective lens 5x, 10x, 20x, 50x, 100x *IR-Light soce 50W、Reflection, Transparence, Note PC, XY manual stage, DT-enhancer ( real time image enhance software |
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| Efect prosessing image sample | ||||
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| Real image sample | DT-enhancer useing image sample | |||
| Difect image sample | ||||
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| 10x sample | 20x sample | |||
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| 50x sample | 100x sample | |||